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dc.contributor.authorErdoan, B.Y. and Demir, U.
dc.date.accessioned2021-04-08T12:10:56Z
dc.date.available2021-04-08T12:10:56Z
dc.date.issued2010
dc.identifier10.1016/j.electacta.2010.06.051
dc.identifier.issn00134686
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-77955712365&doi=10.1016%2fj.electacta.2010.06.051&partnerID=40&md5=9cfc775c62203dde0b789629438808cf
dc.identifier.urihttp://acikerisim.bingol.edu.tr/handle/20.500.12898/5089
dc.description.abstractThis study reports on the synthesis of ternary semiconductor (Bi xSb1-x)2Te3 thin films on Au(1 1 1) using a practical electrochemical method, based on the simultaneous underpotential deposition (UPD) of Bi, Sb and Te from the same solution containing Bi3+, SbO+, and HTeO2+ at a constant potential. The thin films are characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), energy dispersive spectroscopy (EDS) and reflection absorption-FTIR (RA-FTIR) to determine structural, morphological, compositional and optic properties. The ternary thin films of (Bi xSb1-x)2Te3 with various compositions (0.0 ≤ x ≤ 1.0) are highly crystalline and have a kinetically preferred orientation at (0 1 5) for hexagonal crystal structure. AFM images show uniform morphology with hexagonal-shaped crystals deposited over the entire gold substrate. The structure and composition analyses reveal that the thin films are pure phase with corresponding atomic ratios. The optical studies show that the band gap of (BixSb1-x)2Te3 thin films could be tuned from 0.17 eV to 0.29 eV as a function of composition. © 2010 Elsevier Ltd. All rights reserved.
dc.language.isoEnglish
dc.sourceElectrochimica Acta
dc.titleOne-step electrochemical preparation of the ternary (BixSb 1-x)2Te3 thin films on Au(1 1 1): Composition-dependent growth and characterization studies


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