The thickness effect of insulator layer between the semiconductor and metal contact on C-V characteristics of Al/Si3N/p-Si device
| dc.contributor.author | İKRAM ORAK and ADEM KOÇYİĞİT | |
| dc.date.accessioned | 2021-04-02T12:13:54Z | |
| dc.date.available | 2021-04-02T12:13:54Z | |
| dc.date.issued | 2017 | |
| dc.identifier | null | |
| dc.identifier.issn | null | |
| dc.identifier.uri | https://app.trdizin.gov.tr/makale/TWpRek1UWTJOZz09/the-thickness-effect-of-insulator-layer-between-the-semiconductor-and-metal-contact-on-c-v-characteristics-of-al-si3n-p-si-device | |
| dc.identifier.uri | http://acikerisim.bingol.edu.tr/handle/20.500.12898/3090 | |
| dc.source | Pamukkale Üniversitesi Mühendislik Bilimleri Dergisi | |
| dc.title | The thickness effect of insulator layer between the semiconductor and metal contact on C-V characteristics of Al/Si3N/p-Si device |
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