dc.contributor.author | Kaçal, Mustafa Recep | |
dc.contributor.author | Han, İbrahim | |
dc.contributor.author | Akman, Ferdi | |
dc.date.accessioned | 2015-04-13T11:38:27Z | |
dc.date.available | 2015-04-13T11:38:27Z | |
dc.date.issued | 2015-04-10 | |
dc.identifier.uri | http://epjd.epj.org/articles/epjd/abs/2015/04/d140807/d140807.html | |
dc.identifier.uri | http://hdl.handle.net/11472/634 | |
dc.description.abstract | In the present work, the K-shell absorption jump factors and jump ratios for 30 elements between Ti (Z = 22) and Er (Z = 68) were measured by energy dispersive X-ray fluorescence (EDXRF) technique. The jump factors and jump ratios for these elements were determined by measuring the K shell fluorescence parameters such as the Kα X-ray production cross-sections, K shell fluorescence yields, Kβ-to-Kα X-rays intensity ratios, total atomic absorption cross sections and mass attenuation coefficients. The measurements were performed using an Am-241 radioactive point source and a Si (Li) detector in direct excitation and transmission experimental geometry. The results for jump factors and jump ratios were compared with theoretically calculated and the ones available in the literature. | tr_TR |
dc.language.iso | eng | tr_TR |
dc.relation.isversionof | http://dx.doi.org/10.1140/epjd/e2015-50807-3 | tr_TR |
dc.subject | Atomic Physics | tr_TR |
dc.title | Measurements of K shell absorption jump factors and jump ratios using EDXRF technique | tr_TR |
dc.type | Article | tr_TR |