Yazar "Ejderha, K. and Orak, I. and Duman, S. and Turut, A." için listeleme
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The Effect of Thermal Annealing and Measurement Temperature on Interface State Density Distribution and Time Constant in Ni/n-GaP Rectifying Contacts
Ejderha, K. and Orak, I. and Duman, S. and Turut, A. (2018)The capacitance–frequency (C–f) and conductance–frequency (G–f) characteristics of the as-deposited and 400°C annealed Ni/n-GaP/Al diode were measured in a temperature range of 100–320 K with steps of 20 K. The values of ...
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