Determination of L X-ray fluorescence parameters for Ho, Lu, W, Hg and Bi

dc.contributor.author	Turhan, M.F. and Durak, R. and Akman, F.
dc.date.accessioned	2021-04-08T12:09:40Z
dc.date.available	2021-04-08T12:09:40Z
dc.date.issued	2014
dc.identifier	10.1016/j.apradiso.2014.01.025
dc.identifier.issn	09698043
dc.identifier.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84896082395&doi=10.1016%2fj.apradiso.2014.01.025&partnerID=40&md5=15af7b0d77bfb2e1fe585ea446d63599
dc.identifier.uri	http://acikerisim.bingol.edu.tr/handle/20.500.12898/4874
dc.description.abstract	In this work, L X-ray fluorescence cross sections, L sub-shell fluorescence yields and level widths and radiative vacancy transfer probabilities of L sub-shells to Mi, Ni and Oi sub-shells were measured for the elements Ho, Lu, W, Hg and Bi. Energy dispersive X-ray fluorescence (EDXRF) technique was used to measure L X-ray photons. To obtain related parameters, we used 59.54keV gamma photons of 241Am radioactive point source. Emitted L X-ray photons from targets were collected by means of a Si(Li) detector with resolution of 180eV at 5.9keV. The present results are generally in a good agreement with theoretical calculations and the other results obtained in the literature, within their range considering experimental uncertainty. © 2014 Elsevier Ltd.
dc.language.iso	English
dc.source	Applied Radiation and Isotopes
dc.title	Determination of L X-ray fluorescence parameters for Ho, Lu, W, Hg and Bi

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