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dc.contributor.authorSoylu, M. and Al-Ghamdi, A.A. and Omran, S.B. and Yakuphanoglu, F.
dc.date.accessioned2021-04-08T12:09:23Z
dc.date.available2021-04-08T12:09:23Z
dc.date.issued2014
dc.identifier10.1016/j.jallcom.2014.08.048
dc.identifier.issn09258388
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84906871609&doi=10.1016%2fj.jallcom.2014.08.048&partnerID=40&md5=8d1ca56e5ebfa11f2ca8a92aae0e4362
dc.identifier.urihttp://acikerisim.bingol.edu.tr/handle/20.500.12898/4824
dc.description.abstractCuBO2/p-Si diode is a new rectifying structure with photosensing, which is a candidate for producing high voltage protection circuit in electronic application. It has been seen that the photocurrent in the reverse bias I-V characteristic is strongly increased by photo-illumination. It is believed that the combination of thin CuBO2 layer and p-Si will provide high voltage protection level, which does not exist for conventional Si diodes. The capacitance and conductance-voltage characteristics were measured at various frequencies. The results indicate that the electrical parameters of CuBO2/p-Si diode are affected by the series resistance and interface states. The optical properties of the CuBO2 thin film were analyzed by UV-vis-NIR spectrophotometry and FTIR studies. The optical band gap of the CuBO2 is located in the ultraviolet (UV) range. In this spectral range, the BOB bonds and relationship between Cu2+-O are confirmed. © 2014 Elsevier B.V. All rights reserved.
dc.language.isoEnglish
dc.sourceJournal of Alloys and Compounds
dc.titleRectifying structure with high voltage operation based on CuBO2 as an UV photocatalyst


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