A novel photodiode based on Ruthenium(II) complex containing polydentate pyridine as photocatalyst

Abstract

Ruthenium(II)-complex thin film, bearing pyridine-based tridentate was deposited on p-Si substrate by spin coating technique. The I-V measurements across the junction showed rectifying behavior. The reverse bias current of the heterojunction diode increased with increasing illumination intensity. The sensitivity to the light of I-V characteristics was attributed to the photocatalytic effect of Ruthenium(II)-complex. Ruthenium(II)-complex thin film exhibited a transparency higher than 70% in the visible part of the spectrum. The band gap of Ruthenium(II)-complex film was calculated to be 4.42 eV. The reflectance data can be analyzed to determine optical constants such as refractive index and dielectric constant. The results indicate that Ruthenium(II)-complex can be used in fabrication of high photosensitive diodes. © 2015 Elsevier Ltd. All rights reserved.