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dc.contributor.authorTurhan, Mehmet Fatih
dc.contributor.authorDurak, Rıdvan
dc.contributor.authorAkman, Ferdi
dc.date.accessioned2014-09-24T11:23:49Z
dc.date.available2014-09-24T11:23:49Z
dc.date.issued2014-07-01
dc.identifier.issn09698043
dc.identifier.urihttp://hdl.handle.net/11472/265
dc.description.abstractIn this work, L X-ray fluorescence cross sections, L sub-shell fluorescence yields and level widths and radiative vacancy transfer probabilities of L sub-shells to Mi, Ni and Oi sub-shells were measured for the elements Ho, Lu, W, Hg and Bi. Energy dispersive X-ray fluorescence (EDXRF) technique was used to measure L X-ray photons. To obtain related parameters, we used 59.54keV gamma photons of 241Am radioactive point source. Emitted L X-ray photons from targets were collected by means of a Si(Li) detector with resolution of 180eV at 5.9keV. The present results are generally in a good agreement with theoretical calculations and the other results obtained in the literature, within their range considering experimental uncertainty.tr_TR
dc.language.isoengtr_TR
dc.publisherElsevier Ltdtr_TR
dc.relation.isversionof10.1016/j.apradiso.2014.01.025tr_TR
dc.subjectCross sectiontr_TR
dc.subjectfluorescence yieldtr_TR
dc.subjectlevel widthtr_TR
dc.subjectradiative transitiontr_TR
dc.subjectvacancy transfertr_TR
dc.subjectx-raytr_TR
dc.titleDetermination of L X-ray fluorescence parameters for Ho, Lu, W, Hg and Bitr_TR
dc.typeArticletr_TR


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